Photoluminescence inspection system assists solar wafer production
Production process control is considered a key success factor for the solar industry. However, this is only part of the favorable conditions for success: In order to fully optimize production and reduce costs, producers must take further steps to ensure that only defect-free materials are processed.
Automatic inspection of solar cell silicon wafers through machine vision technology
With the increase of labor costs, at the same time, in order to ensure the absolute quality of products, avoid product quality problems caused by many human factors, such as secondary pollution and sorting fragments. It is the future development trend of photovoltaic manufacturing technology to use machine vision inspection technology to replace manual labor to objectively and reliably monitor and sort the quality defects of silicon wafers and cells.
Teledyne DALSA Introduces Line Scan Cameras for Flat Panel Displays and Machine Vision
[According to the US "Military Aerospace" report on April 17, 2017] In April 2017, Canada's Teledyne DALSA launched the Linea 16k CLHS low-voltage system for flat panel displays, printed circuit boards, network inspection and general machine vision optoelectronic systems Cost line scan cameras.
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